Measurement
Nikon Metrology Acquires Avonix Imaging
The companies will further advance the development of new products, especially in the automotive and aerospace industries.
Read MoreZeiss CMM Range Reduces Carbon Footprint
Zeiss Prismo CMMs are designed for use both in the controlled environment of a laboratory and in the harsh environment of a production line.
Read MoreMitutoyo Measurement System Provides High Repeatability
Mitutoyo’s LH600F/FG Linear High Measurement System features a high-accuracy scale unit and guiding mechanism manufactured in the company’s Japanese facilities.
Read MoreMade to Measure Expands Operations to the West Coast
The second location in Orange County, California, will offer a suite of services and local presence for the company’s growing base of clients on the West Coast and in the western states.
Read MoreL.S. Starrett Company Gage Enables Compact Handling
The 765A Electronic Snap Gage is designed for machinists, quality control personnel and others who need to quickly measure the size of materials up to 0.5" (12.7 mm) thick.
Read MoreYou Are Not Spending Enough on Gaging
Is there an intuitive ratio shaping shops’ perceptions of how much gaging capacity is appropriate for their machining capacity? Much has changed; that ratio might need to be reconsidered.
Read MoreZeiss Measurement Software Features Automated Fault Analysis
Zeiss Calypso 2023 offers an improved fault analysis, optimized workflows for optical CMMs, better usability and advanced GD&T evaluations.
Read MoreCombining Multiple Probes: A Recipe for Success
Combining measurement techniques enables a wide range of relational characteristics to be measured with just one or two sensors.
Read MoreHommel-Etamic Measurement System Offers Modular Design
The W600 series features high measurement quality, free access to measuring points, rapid changeover of the probe system, automatic probe and probe arm recognition.
Read MoreNikon Metrology's CT System Offers Enhanced Resolution
The VOXLS 40 C 450 X-ray computed tomography system is designed to inspect items of diverse size and density, internally and externally.
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