Lightweight Vanta Element Analyzes Metal Alloy Grades
The Vanta Element X-ray fluorescence (XRF) analyzer from Olympus is designed as a cost-effective model that still provides speed, reliability, connectivity and ease of use.
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ECi Software Solutions, Inc.
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With a dual-core processor powered by Olympus’ Axon technology, the lightweight Vanta Element X-ray fluorescence (XRF) analyzer has the same stability and resolution as the rest of the Vanta series. It is designed as a cost-effective model that still provides speed, reliability, connectivity and ease of use.
The screen clearly displays material and grade IDs, as well as comparisons of different alloy grades. Built for demanding environments, the Vanta Element is IP54-rated for resistance to dust and moisture and constructed to pass a 4-ft. drop test (MIL-STD-810G). For additional protection, a stainless steel faceplate is paired with a thick (50-micron) Kapton window that can be easily attached and removed for window changes on the shop floor. The device can perform continuously in temperatures ranging from 14°F to 113°F (-10°C to 45°C).
The analyzer can connect to the Olympus Scientific Cloud for wireless data sharing and access to fleet management tools like the Olympus mobile app. The analyzer also has an industrial 1-GB MicroSD card for storing results and two USB ports for data export Compatible accessories include the Vanta field stand, soil foot, probe shield and holster.
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