Surface Finish Probe Expands CMM Capability
Renishaw's SFP2 surface finish probe is designed for use with its REvo five-axis measurement system on coordinate measuring machines (CMMs).
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Autodesk, Inc.
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Renishaw’s SFP2 surface finish probe is designed for use with its Revo five-axis measurement system on coordinate measuring machines (CMMs). The SFP2 system consists of a probe and a range of modules, and is automatically interchangeable with all other probe options available for Revo.
The probe is said to increase the surface finish measurement ability of the Revo system, which offers a multi-sensor capability providing touch-trigger, high-speed tactile scanning plus non-contact vision measurement on a single CMM. The combination of surface finish measurement and dimensional inspection on one CMM offers time savings, reduced part handling and greater return on investment, the company says.
The surface finish system is managed by the same I++ DME compliant interface as the Revo system, and user functionality is provided by Renishaw's Modustm metrology software.
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