Roughness, Contour Measuring Devices Improve Speed
IMTS 2018: Jenoptik’s Waveline W800 roughness and contour measuring devices have been designed for flexible, precise and fast measurement.
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Takumi USA
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Autodesk, Inc.
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DMG MORI - Cincinnati
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Jenoptik’s Waveline W800 series of roughness and contour measuring devices includes four configurations. A 120-mm traverse unit and a 500-mm vertical measuring column are included on basic configurations.
The new models have an axis travel speed six times faster than previous models. Approximately 30 percent more ambient noise can be filtered from results compared to existing models. The series offers a probing system for a variety of measuring tasks in the measuring room, including manual or semi-automated measuring processes. The probing systems can be exchanged using a magnetic quick-change adapter for flexibility in daily measurement routines. Measuring station components are modular and can be expanded later or integrated into existing measuring systems.
The company’s measuring instruments include models that work in multiple measurement runs as well as models that measure in a single probe step. Mobile and stationary systems for simple or complex measuring tasks are available.
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