Published 12/17/2012

Probe Option for CMMs

Renishaw’s SFP1 probe option for the Revo five-axis measurement system enables surface finish inspection to be integrated within coordinate measurement routines.

Edited by: MMS Editorial Team

Renishaw’s SFP1 probe option for the Revo five-axis measurement system enables surface finish inspection to be integrated within coordinate measurement routines. The single platform metrology system eliminates the need for handheld surface measurement devices and transportation of parts to a dedicated surface measuring machine. The system can automatically switch between dimensional and surface-finish measurement, keeping the analysis contained to a single report.

The fully integrated probe features 6.3 to 0.05 Ra measurement capability. The five-axis measurement system is equipped with two dedicated styli, straight and cranked, which are selected via the measurement program control using the modular rack system (MRS). The probe incorporates a C axis that enables the probe tip to be automatically oriented to any angle to suit the part, the company says. Using the straight stylus, the probe can perform a measurement trace within a 10-mm-diameter bore to a depth of 100 mm.

The skidded probe is equipped with a 2 µm (0.000079") radius diamond stylus tip. It outputs Ra, RMS and raw data formats to the metrology application software via Renishaw’s UCCServer software, using the I++ DME protocol. The raw data can be subsequently presented to specialized surface analysis software for more detailed reporting.

Probe calibration is automated under the CMM program. A surface finish calibration artifact (SFA) is mounted on the MRS rack and is measured using the probe. Software then adjusts parameters within the probe in accordance with the artifact’s calibrated value.

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