Measurement
Starrett Offers Limited-Edition, Themed Micrometers
The L.S. Starrett Company is releasing two themed micrometers: one based on Camouflage, the other around American Pride.
Read MoreExact Metrology To Distribute PolyScan XL Surround Scanner
Exact Metrology is now distributing Polyrix’s PolyScan XL line of Surround 3D Scanners, which function while motionless and require no data alignment targets.
Read MoreRenishaw's Free CARTO 4.2 Update Enhances XM-60
Renishaw’s CARTO 4.2 software suite provides new features for calibration equipment, notably extending the measurement range of the XM-60.
Read MoreCMM Products Announces Expansion into Southeast Market
CMM Products is expanding into the Southeast market to better support aerospace and automobile customers.
Read MoreMarposs Minimicromar3 Grinding Gage Durable Against Coolants
Marposs’ Minimicromar3 provides precise measurement for small surfaces. It is also highly durable against coolant and abrasive substances.
Read MoreHamar Laser's A-1700 Enables Wireless Roll Alignment
Hamar Laser Instruments has released its wireless A-1700 Roll-Leveling Kit, an electronic level which provides high-accuracy wireless data to Hamar’s R-1357-2.4ZB PDA Display.
Read MoreDigitalized Job Shop Scales Up
New software sparks new thinking about meeting quality certification requirements without stifling growth.
Read MoreTips for Choosing Filter Settings When Measuring Round Shapes
When interpreting measurement data, the correct filter setting is necessary to see the difference between surface roughness and part roundness.
Read MoreBruker Releases New ContourX 3D Optical Profilometers
Bruker’s new generation of ContourX 3D Optical Profilers leverages a range of software and design enhancements to improve usability, field of view and nanoscale performance.
Read MoreBuehler Releases New Wilson RH2150 Rockwell Hardness Tester
Buehler is releasing the Wilson RH2150 Rockwell Hardness Tester during Wilson’s centennial anniversary. The tester features many user-friendly enhancements.
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