Verisurf 2022 Features Sweeping Automation Update
Verisurf 2022 includes automated path generators, inspection plan creation and more. Model-based definition also received a significant update.
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Verisurf 2022 is now available for download for all new and current customers with valid maintenance agreements. This update adds new performance enhancements and productivity features to the measurement and scanning software.
These enhancements include an automated path generator that can develop the CMM path as features are added to a plan, as well as a simulator that detects potential collisions on CMM paths and performs corrections with clearance-point editing. Feature zone display and pre-selection of features fine tunes data extraction from the inspection plan, while pre-filtering data using CAD entities takes data extraction and multi-step alignment a step further to automate cross-section analysis.
Model-based definition now extends to meshes, including thickness analysis on measured meshes. This enables users to create intelligent meshes for inspecting additively-manufactured parts. Users can also automate inspection plan creation by automatically applying associative tolerances and feature control frames from model-based definition to plans and reports.
Verisurf can also now read and write to large-volume terrestrial scanner datasets in the E57 format. Large datasets are also segmented into manageable blocks to facilitate simpler extraction, fitting, analysis and meshing.
Real-time scanning acquisition rates for Verisurf now exceed two million points per second, while real-time point-cloud clipping provides cleaner scan data. Users can also use filter zones based on CAD geometry to rapidly remove erroneous data.
The software’s graphics window and “Automate Manager” now includes search, highlight and “go-to” features for ease of use. Users can also visualize the profile-deviation outline and tolerance bands in the graphics window.
A quick drift analysis feature helps users swiftly determine whether parts, tools or devices have moved — common occurrences as the result of temperature change, harmonics or physical contact.
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