Roughness Sensor Measurement on a CMM
The new Zeiss Rotos sensor enables the use of coordinate measuring machines to completely inspect surface waviness and roughness, even on complex workpieces, and all in a single measurement run without any reclamping.
The new Zeiss Rotos sensor enables the use of coordinate measuring machines to completely inspect surface waviness and roughness, even on complex workpieces, and all in a single measurement run without any reclamping. This cutting-edge innovation simplifies and speeds up the measurement of all surface parameters from the drawing in a single measurement cycle.
The Zeiss Rotos sensor makes it is possible to check the size, form and location tolerances together with the roughness parameters on a single machine. Instead of requiring separate stylus instruments to capture more significant form deviations, these can now be performed on Prismo and CenterMax CMMs. The sensor can easily be exchanged as needed using an interface on the CMM probe. Depending on the measuring machine and the particular stylus, you can capture Ra roughness values of up to 0.03 µm with this new sensor.
The innovative design of the new Zeiss Rotos enables the inspection of nearly all workpiece characteristics. Thanks to the three rotatable, multiple-stylus arms, it is also possible to measure deep boreholes and difficult-to-reach surfaces. Even overhead measurements are not a problem for the Zeiss Rotos. The new features also include skidless styli intended for measuring roughness and waviness on sealing faces. Programming the surface parameters is quick and easy, because the Zeiss Rotos is completely integrated in Calypso, the Zeiss measuring software.
Companies can now benefit from no longer having to invest in separate systems for on-line roughness measurements. With the Zeiss Rotos sensor, the operator also avoids having to reclamp parts and transport them between roughness measurement systems and CMMs. Surface roughness can be analyzed and visualized in a customized, professional display together with size, form and location in Zeiss PiWeb reporting.
Stop by the Zeiss booth, E-135502, to see how roughness measurement is integrated on a CMM!