Renishaw Launches the Modus 2 Metrology Software Suite

Renishaw is pleased to announce the launch of its Modus 2 metrology software suite, which brings new levels of clarity and efficiency to the programming and operation of CMMs.

Based on the established and highly capable Modus platform and supporting Renishaw’s suite of three- and five-axis CMM sensor technologies, Modus 2 has been designed with usability in mind. The innovative interface is simple for new users to learn and faster to program, resulting in unprecedented levels of productivity with or without a CAD model.

The user experience is designed to be identical whether the software is connected to a “live” CMM or working in an offline environment, where full simulation with speed control allows measurement sequence development and visualization.

A complete redesign of the software interface with the introduction of “Off Surface” motion technology, intelligent measurement strategies, automatic reporting and an interactive virtual CMM environment are just some of the innovations that enhance the user experience. From simple manual CMM operation to complex part measurement on multi-axis systems, Modus 2 adapts automatically and only offers functionality relevant to the current task.

Intelligent extraction of CAD data and knowledge of underlying geometry determine the measurement strategy. However, consistency in measurement methods is paramount across an organization, and Modus 2 facilitates this by allowing users to collaborate on data collection properties and parameters such as fitting algorithms and filters.

From September 12-17, 2016 at IMTS 2016, visitors will be able to see the new Modus 2 metrology suite demonstrated by Renishaw at booth E-5509.

Visit the company's IMTS showroom for more information.