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New Encoders From Heidenhain Implement Metrology Designs

Heidenhain’s new encoders allow machine manufacturers to obtain multiple measurements simultaneously and facilitate correcting deviations on the fly.

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Heidenhain's chip encoders.
Photo Credit: Heidenhain

With the release of new Multi Degrees of Freedom (Multi-DOF) encoders, Heidenhain offers machine manufacturers a way to implement metrology designs, allowing them to obtain multiple measurements simultaneously and facilitate correcting deviations on the fly. The three new encoders include the LIP 6031 Dplus, GAP 1081 and MKV 1/9x30.

According to Heidehain, using multiple reader heads allows for the detection of deflections, allowing for the necessary compensation at the inception and ensuring the integrity of the machine.

Highlights of Heidehain’s three new MULTI-DOF encoders include:

  • The LIP 6031 Dplus integrates two LIP 6000 encoders into a single device to read two graduation tracks on a measuring scale angled at ±45 degrees relative to each other. According to the company, this makes it possible to measure in both the main direction and orthogonally to the main direction at a measuring length of ±2 mm.
  • The GAP 1081 enables measurement of the gap between a mirrored scale and the scanning head. This reportedly makes out-of-plane measurement very easy to implement in a metrology design.
  • The MKV 1/9x30 enables the bus capabilities of EnDat 3 interface by reading the position values of up to four 1 VPP scanning heads. The company says this allows readings from each head to be calculated and sent to the customer’s controller on just a single cable. It also reduces the number of cables required and prevents the controller from needing to make such calculations.

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