High-Resolution Microscope Provides Large Depth of Field
Nikon Metrology offers the NeoScope II, a high-resolution scanning electron microscope (SEM) that produces images with a large depth of field at magnifications.
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The base unit measures 330 × 490 × 430 mm and weighs 50 kg. It uses single-phase 100- to 240-V, 50-/60-Hz, or 700- to 960-V power.
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