Conference To Showcase Metrology Success Stories
The Coordinate Metrology Society, a membership association for measurement professionals, has announced its “Call for Papers” for the 25th Coordinate Metrology Systems Conference (CMSC). Metrology users from leading manufacturers and science laboratories are invited to submit abstracts for white papers illustrating their successful application of 3D coordinate measuring systems. Submissions will be reviewed by the society and considered for presentation at CMSC, an annual event scheduled for July 20-24, 2009 in Louisville, Kentucky.
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The Coordinate Metrology Society, a membership association for measurement professionals, has announced its “Call for Papers” for the 25th Coordinate Metrology Systems Conference (CMSC). Metrology users from leading manufacturers and science laboratories are invited to submit abstracts for white papers illustrating their successful application of 3D coordinate measuring systems. Submissions will be reviewed by the society and considered for presentation at CMSC, an annual event scheduled for July 20-24, 2009 in Louisville, Kentucky. The deadline for abstracts is April 10.
The CMSC is the only North American conference dedicated solely to users of portable, high-precision measurement technology used to inspect manufactured and assembled components on the factory floor. At last year’s conference, topics for white paper presentations ranged from the use of 3D metrology in automotive development to 3D scanning in the Gobi Desert.
For more information, visit www.cmsc.org.